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      AuthorBoon, Chirn Chye (3)Chan, Lye Hock (3)
      Chew, Kok Wai Johnny (3)
      Do, Manh Anh (3)
      Loo, Xi Sung (3)
      Ong, Shih Ni (3)
      Yeo, Kiat Seng (3)
      Date
      2009 (3)
      SubjectEngineering (3)... View More

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      Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs 

      Ong, Shih Ni; Yeo, Kiat Seng; Chew, Kok Wai Johnny; Chan, Lye Hock; Loo, Xi Sung; Do, Manh Anh; Boon, Chirn Chye (2009)
      A simple high frequency channel thermal noise model was developed for MOSFETs in strong inversion region. Short channel effects such as channel length modulation effect and mobility degradation due to vertical field ...
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      A new unified model for channel thermal noise of deep sub-micron RFCMOS 

      Ong, Shih Ni; Yeo, Kiat Seng; Chan, Lye Hock; Loo, Xi Sung; Boon, Chirn Chye; Do, Manh Anh; Chew, Kok Wai Johnny (2009)
      A new unified model for circuit simulation is presented to predict the high frequency channel thermal noise of deep sub-micron MOSFETs in strong inversion region. Based on the new channel thermal noise model, the simulated ...
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      High frequency drain current noise modeling in MOSFETs under sub-threshold condition 

      Chan, Lye Hock; Yeo, Kiat Seng; Chew, Kok Wai Johnny; Ong, Shih Ni; Loo, Xi Sung; Boon, Chirn Chye; Do, Manh Anh (2009)
      A new high frequency drain current noise model was developed for MOSFETs under sub-threshold condition. A simple parameter extraction technique is proposed, which utilizes Y-parameter analysis on the RF small-signal ...

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