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MOSFET drain current noise modeling with effective gate overdrive and junction noise

Chan, L. H. K.; Yeo, Kiat Seng; Chew, Kok Wai Johnny; Ong, Shih Ni; Loo, Xi Sung; Boon, Chirn Chye; Do, Manh Anh (2012)

In this letter, a drain current noise model that includes the channel thermal noise and the shot noise generated at the source-bulk junction and the drain-bulk junction is presented. A unified analytical expression is ...

Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs

Ong, Shih Ni; Yeo, Kiat Seng; Chew, Kok Wai Johnny; Chan, L. H. K.; Loo, Xi Sung; Boon, Chirn Chye; Do, Manh Anh (2012)

This paper discusses the impact of the short channel effects, such as channel length modulation (CLM), velocity saturation effect (VSE) and hot carrier effect (HCE), on the channel thermal noise model of short channel ...