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Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs
(2009)
A simple high frequency channel thermal noise
model was developed for MOSFETs in strong inversion region.
Short channel effects such as channel length modulation effect
and mobility degradation due to vertical field ...
A new unified model for channel thermal noise of deep sub-micron RFCMOS
(2009)
A new unified model for circuit simulation is
presented to predict the high frequency channel thermal
noise of deep sub-micron MOSFETs in strong inversion
region. Based on the new channel thermal noise model, the
simulated ...
High frequency drain current noise modeling in MOSFETs under sub-threshold condition
(2009)
A new high frequency drain current noise model was developed for MOSFETs under sub-threshold condition. A simple parameter extraction technique is proposed, which utilizes Y-parameter analysis on the RF small-signal ...
