Now showing items 1-2 of 2
Modeling and layout optimization of differential inductors for Silicon-based RFIC applications
A scalable RF differential inductor model has been developed, enabling device performance versus layout size tradeoffs and optimization as well as accurate circuit predictions. Comparing inductors with identical inductance ...
Novel RF process monitoring test structure for silicon devices
This paper demonstrates a novel RFCMOS process monitoring test structure. Outstanding agreement in dc and radio frequency (RF) characteristics has been observed between conventional test structure and the new process ...