Now showing items 1-4 of 4
White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert ...
White light interferometer with color CCD for 3D-surface profiling of microsystems
White light interferometry (WLI) is a state-of-the-art technique for high resolution full-filed 3-D surface profiling of Microsystems. However, the WLI is rather slow, because the number of frames to be recorded and evaluated ...
Measurement of large discontinuities using single white light interferogram white light interferogram
White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram ...
Use of two wavelengths in microscopic TV holography for nondestructive testing
Single wavelength TV holography is a widely used whole-field noncontacting optical method for nondestructive testing (NDT) of engineering structures. However, with a single wavelength configuration, it is difficult to ...