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Issue DateTitleAuthor(s)
12022The impact of a number of samples on unsupervised feature extraction, based on deep learning for detection defects in printed circuit boardsVolkau, Ihar; Abdul Mujeeb; Dai, Wenting; Erdt, Marius; Sourin, Alexei
22020Appearance-driven conversion of polygon soup building models with level of detail control for 3D geospatial applicationsChen, Kan; Johan, Henry; Erdt, Marius
32019A two-stage outlier filtering framework for city-scale localization using 3D SfM point cloudsCheng, Wentao; Chen, Kan; Lin, Weisi; Goesele, Michael; Zhang, Xinfeng; Zhang, Yabin