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Issue DateTitleAuthor(s)
112019Strong links promote the emergence of cooperative elitesGallo, Edoardo; Riyanto, Yohanes E.; Teh, Tat-How; Roy, Nilanjan
122012Photophysical investigation of charge recombination in CdS/ZnO layers of CuIn(S,Se)2 solar cellNalla, Venkatram; Ho, John C. W.; Batabyal, Sudip K.; Wang, Yue; Tok, Alfred Iing Yoong; Sun, Handong; Wong, Lydia H.; Zheludev, Nikolay
132015Phase errors elimination in compact digital holoscope (CDH) based on a reasonable mathematical modelWen, Yongfu; Qu, Weijuan; Cheng, Cheeyuen; Wang, Zhaomin; Asundi, Anand
142018Transfer Hawkes processes with content informationLi, Tianbo; Wei, Pengfei; Ke, Yiping
152018All-dielectric free-electron-driven holographic light sourcesClarke, Brendan P.; Gholipour, Behrad; MacDonald, Kevin F.; Zheludev, Nikolay I.
162016A Selective and Purification-Free Strategy for Labeling Adherent Cells with Inorganic NanoparticlesGao, Yu; Lim, Jing; Yeo, David Chen Loong; Liao, Shanshan; Lans, Malin; Wang, Yaqi; Teoh, Swee-Hin; Goh, Bee Tin; Xu, Chenjie
172017Versatile telluracycle synthesis via the sequential electrophilic telluration of C(sp2)–Zn and C(sp2)–H bondsWu, Bin; Melvina; Wu, Xiangyang; Yeow, Edwin Kok Lee; Yoshikai, Naohiko
182018The effect of linker DNA on the structure and interaction of nucleosome core particlesHuang, Yen-Chih; Su, Chun-Jen; Korolev, Nikolay; Berezhnoy, Nikolay V.; Wang, Sai; Soman, Aghil; Chen, Chun-Yu; Chen, Hsin-Lung; Jeng, U-Ser; Nordenskiöld, Lars
192017A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFETGu, Chenjie; Ang, Diing Shenp; Gao, Yuan; Gu, Renyuan; Zhao, Ziqi; Zhu, Chao
202017Theta products and eta quotients of level 24 and weight 2Alaca, Ayşe; Alaca, Şaban; Aygin, Zafer Selcuk

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